This set of VLSI Question Bank focuses on “Doping Process of GA-2”. 1. ______ is a direct gap material with valence bond maximum. a) silicon b) gallium oxide c) gallium arsenide d) silicon arsenide 2. Narrow valleys correspond to a) electrons with lower mass state b) protons with lower mass state c) electrons with higher … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Doping Process of GA-1”. 1. Addition of impurities is essential for creating switching devices. a) true b) false 2. The behaviour of the switching element is decided by a) selection of impurity b) concentration density c) selection of impurity & concentration density d) … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Gallium Arsenide VLSI”. 1. Gallium arsenide has _______ electron mobility. a) high speed b) low speed c) smaller d) larger 2. Which technology has semi-insulating substrate? a) silicon b) silicon nitride c) gallium oxide d) gallium arsenide 3. Gallium is produced as a … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Submicron CMOS”. 1. Submicron CMOS technology is a) faster b) slower c) large d) slow and large 2. In CMOS devices, which has slower performance? a) n-transistor b) p-transistor c) all of the mentioned d) none of the mentioned 3. As the channel … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Design for Testability”. 1. Design for testability is considered in production for chips because: a) Manufactured chips are faulty and are required to be tested b) The design of chips are required to be tested c) Many chips are required to be tested … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Fault Models”. 1. Which are processing faults? a) missing contact window b) parasitic transistor c) oxide breakdown d) all of the mentioned 2. Surface impurities occurs due to ion migration. a) true b) false 3. Electromigration is a a) processing fault b) material … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Automatic Test Pattern Generation”. 1. Automatic test pattern generator detects only the fault and not its cause. a) true b) false 2. The automatic test pattern generator method has ________ phases. a) two b) three c) four d) five 3. Faults which produce … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Test Pattern Generators”. 1. The test pattern generator which uses a shift register along with LFSR is of __________ bits. a) N b) M c) N+M d) N*M 2. The N+M bit test pattern generator has __________ different patterns produced. a) 2(N+M) b) … Read more
This set of VLSI online quiz focuses on “Pseudo-Random Test Patterns-2”. 1. Pseudo random testing can determine the test length. a) true b) false 2. The pseudo-random testing has a) high cost b) less development time c) low cost but more testing time d) low cost and less testing time 3. In pseudo-random testing, the … Read more
This set of VLSI Multiple Choice Questions & Answers (MCQs) focuses on “Pseudo-Random Test Patterns-1”. 1. Which exhibits low fault coverage? a) random test pattern b) pseudo random test pattern c) deterministic test pattern d) algorithmic test pattern 2. Large AND function will produce _______ infrequently. a) logic 0 b) logic 0 and logic 1 … Read more
