This set of VLSI Multiple Choice Questions & Answers focuses on “Scan Design Techniques-2”.
1. The serial shift register is driven using
a) one over-lapping clock
b) two over-lapping clock
c) one non over-lapping clock
d) two non over-lapping clock
Explanation: The serial shift register is driven using two non over-lapping clocks which can be controlled by primary inputs of the circuit.
2. Which is used to control the scan path movement?
a) clock signals
b) input signals
c) output signals
d) delay signals
Explanation: Two clock signals are used to control the scan path movements through the shift register latches.
3. The circuit operation is independent of
a) rise time
b) fall time
c) propogation delays
d) all of the mentioned
Explanation: The circuit operation is independent of dynamic characteristics of the logic elements like rise time, fall time and propogation delays.
4. Which is not the function of LSSD method?
a) eliminates hazards
b) eliminates races
c) simplifies fault generation
d) stores the data
Explanation: The advantages of LSSD are that it eliminates races and hazards, simplifies fault generation and fault simulation.
5. Boundary scan test is used to test
Explanation: Boundary scan test involves scan path and self-testing to resolve the problems associated with boards carrying VLSI circuits.
6. The boundary scan path is provided with
a) serial input pads
b) parallel input pads
c) parallel output pads
d) buffer pads
Explanation: The boundary scan path is provided with serial input and output pads and with appropriate clock pads.
7. The boundary scan path tests the
a) input nodes
b) output nodes
c) buffer nodes
d) interconnection points
Explanation: The boundary scan path test the interconnection between the various chips on the board.
8. Boundary scan method takes lesser time on test pattern generation.
Explanation: Boundary scan method takes lesser time on test pattern generation and application.
9. The disadvantage of boundary scan method is that the fault coverage is less.
Explanation: The boundary scan test method is simplified and efficient and also its fault coverage is increased.
10. Which occupies lesser area?
b) boundary scan test
c) serial scan
d) partial scan
Explanation: Partial scan is derived from scan path technique and it consumes very less area.
11. The partial scan approach scan
a) all input node faults
b) all output node faults
c) faults not detected by designer functional vector
d) all faults
Explanation: The partial scan approach detects faults which are not detected by designer’s functional vectors.
12. In scan/set method, __________ is used to implement a scan path
a) serial registers
b) storage elements
c) parallel registers
d) separate register
Explanation: In scan/set method, storage elements are not used to implement a scan path. A separate register is added to scan test data in and out.
Sanfoundry Global Education & Learning Series – VLSI.
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