VLSI Questions and Answers – Guidelines for Testability -3

This set of VLSI Mcqs focuses on “Guidelines for Testability -3”.

1. Counters are
a) sequential circuits
b) synchronous circuits
c) asynchronous circuits
d) buffer circuits
View Answer

Answer: a
Explanation: Counters are sequential circuits and need a large number of input vectors to be fully tested.

2. Wrong readings are recorded due to reset input being
a) dependent of clock signal
b) independent of clock signal
c) dependent of gate signal
d) independent of gate signal
View Answer

Answer: b
Explanation: Since reset input is independent of system clock signal, erroneous readings are being read by the tester.

3. To avoid self resetting, the tester can be over ridden by adding
a) an AND gate
b) an OR gate
c) an EX-OR gate
d) shift registers
View Answer

Answer: b
Explanation: Self resetting can be avoided by adding an OR gate which over rides the tester.
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4. Partitioning technique is not suitable for microprocessor like circuits.
a) true
b) false
View Answer

Answer: b
Explanation: Partitioning technique is very widely used for microprocessor like circuits and using bus structures is related to partitioning technique.

5. The fast rise and fall times give cross-talk problems if
a) they are in close proximity
b) if they are far away
c) it always gives rise to croo-talk problems
d) does not allow croo-talk problems
View Answer

Answer: a
Explanation: The fast rise and fall times of digital signals can give rise to croo-talk problems in analog signal lines if they are in close proximity.
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6. To route digital signals near analog signals _______ must be done.
a) balancing
b) shielding digital signals
c) balancing and shielding
d) crossing
View Answer

Answer: c
Explanation: To route digital signals near analog signals, balancing and shielding of digital signals must be done.

7. To access directly another system ______ is done.
a) skipping
b) alternating
c) by-passing
d) by-setting
View Answer

Answer: c
Explanation: To directly access another sub-system to be tested from one subsystem, by-passing must be performed.
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8. With partitioning, bypassing is performed using
a) buffers
b) multiplexers
c) multipliers
d) dividers
View Answer

Answer: b
Explanation: With partitioning, to directly access a sub-system for testing, bypassing must be done and this is achieved using multiplexers.

9. Bypassing technique works well with
a) dividers
b) counters
c) RAM
d) all of the mentioned
View Answer

Answer: d
Explanation: Bypassing technique works well with counters, dividers, RAM, ROM, PLAs, sequential blocks, analog circuits and internal clocks.
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10. In the bypassing approach, subsystem can be tested
a) exhaustively
b) pseudo-exhaustively
c) repeatedly
d) selectively
View Answer

Answer: a
Explanation: In the bypassing approach, subsystem can be tested exhaustively by controlling the multiplexers based interconnections in the system.

Sanfoundry Global Education & Learning Series – VLSI.

To practice MCQs on all areas of VLSI, here is complete set of 1000+ Multiple Choice Questions and Answers.

If you find a mistake in question / option / answer, kindly take a screenshot and email to [email protected]

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Manish Bhojasia - Founder & CTO at Sanfoundry
Manish Bhojasia, a technology veteran with 20+ years @ Cisco & Wipro, is Founder and CTO at Sanfoundry. He lives in Bangalore, and focuses on development of Linux Kernel, SAN Technologies, Advanced C, Data Structures & Alogrithms. Stay connected with him at LinkedIn.

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