Here is the listing of Best reference books on Advances in Digital and Mixed Signal Testing.
|1. “Essentials of Electronic Testing” by M. L. Bushnell and V. D. Agrawal
Book Review: The book covers the concepts of semiconductor device technology, circuit design, electronic testing which serve as a foundation for VLSI design. The book presents systems on a chip which include digital, memory and mixed signal sub systems. The book covers all types of electronic circuits. This book is useful for undergraduate students who want to take a course on electronic testing. The book also presents various techniques needed for electronic testing. The book is also based on the current trends and techniques in the field of electronic testing.
|2. “Analog and Mixed-signal Boundary Scan: A Guide to the IEEE 1149.4 Test Standard” by A. Osseiran
Book Review: The book contains advanced information and concepts about IEEE standard 1149.4. The book presents a chapter to chapter variation of all the necessary concepts. The book explains the need for organization of the testability of the system. The book also provides architecture for digital VLSI chips. The chips designed with 1149.1 architecture are integrated into a testable system. The book explains that though digital chips are compliant with the standard the testability of a system cannot be guaranteed. The book also provides architecture to mixed signal systems.
|3. “Introduction to IDDQ testing” by S. Chakravarty and P. J. Thadikaran|
|4. “Delay fault testing for VLSI circuits” by A. Krstic and K-T. Cheng|
|5. “Model Engineering in Mixed-Signal Circuit Design: A Guide to Generating Accurate Behavioral Models in VHDL-AMS” by Sorin Alexander Huss|
|6. “Mixed-Signal Layout Generation Concepts” by Arthur Hm Van Roermund Domine Leenaerts Arthur Hm Van Roermund Chieh Lin|
|7. “An Introduction to Mixed-Signal IC Test and Measurement” by Gordon Roberts, Mark Burns|
|8. “Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits” by Yichuang Sun|
|9. “Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits” by Gordon W Roberts Albert K Lu|
|10. “Test and Design-For-Testability in Mixed-Signal Integrated Circuits” by Jose Luis Huertas Diaz|
Sanfoundry Global Education & Learning Series – Best Reference Books!