Kindly note that we have put a lot of effort into researching the best books on Memory Design and Testing subject and came out with a recommended list of top 10 best books. The table below contains the Name of these best books, their authors, publishers and an unbiased review of books on "Memory Design and Testing" as well as links to the Amazon website to directly purchase these books. As an Amazon Associate, we earn from qualifying purchases, but this does not impact our reviews, comparisons, and listing of these top books; the table serves as a ready reckoner list of these best books.
|1. “High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)” by R Dean Adams
“High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)” Book Review: This book is written for the professional and the researcher to help them understand the memories that are being tested. It considers design and test jointly here. It is about the self test of memories, the test of memories and the design of memories. It shows that knowledge of memory design is required to understand the test. It also shows that an understanding of the test is required to have effective built-in self-test implementations. Large numbers of bits require some new methods. This is because fine nuances of fails that were rarely seen previously now will happen regularly on most chips. This book will help the reader understand memory design, comprehend the needed fault modeling, and generate the appropriate text patterns and strategies.
|2. “IEEE International Memory Technology, Design and Testing (MTDT 2002) 2002” by IEEE Computer Society|
|3. “Memory Technology, Design and Testing (Mtdt ’97): 1997 IEEE International Workshop” by IEEE Computer Society|
| 4. “Software Trace and Memory Dump Analysis: Patterns, Tools, Processes and Best Practices” by Dmitry Vostokov and Memory Dump Analysis Services
“Software Trace and Memory Dump Analysis: Patterns, Tools, Processes and Best Practices” Book Review: This is a full-color transcript of Software Diagnostics Services (former Memory Dump Analysis Services) lecture delivered at E2EVC Virtualization Conference in 2011. It introduces an analysis methodology for software execution artefacts. Topics covered include A.C.P. Root Cause Analysis, DA+TA, Spatiality vs. Narrativity, Tools for Artifact Analysis, Checklists for Analysis, etc. Other areas that have been focused upon are Software Behavior Patterns, Adjoint Threads, Selected Trace and Log Analysis Patterns. Trace Analysis Case Study has also been done in detail.
| 5. “Accelerated .NET Memory Dump Analysis: Training Course Transcript and WinDbg Practice Exercises with Notes” by Dmitry Vostokov and Memory Dump Analysis Services
“Accelerated .NET Memory Dump Analysis: Training Course Transcript and WinDbg Practice Exercises with Notes” Book Review: The book has been especially designed for Software technical support and escalation engineers, system administrators, software developers and quality assurance engineers. The prerequisite knowledge required is Basic .NET programming and debugging. The book covers twenty .NET memory dump analysis patterns and some additional unmanaged patterns. The reader will learn how to analyze .NET application and service crashes and freezes. This book will also help in navigating through memory dump space (managed and unmanaged code) and diagnose corruption, leaks, CPU spikes, blocked threads, deadlocks, wait chains, resource contention, etc. WinDbg has been used to diagnose patterns in 32-bit and 64-bit process memory dumps. Step-by-step exercises, notes, source code of modelling applications, questions and answers, etc will help in practicing the learnt concepts.
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|6. “Cloud Memory Dump Analysis” by Dmitry Vostokov and Memory Dump Analysis Services|
| 7. “Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing)” by M Bushnell and Vishwani Agrawal
“Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing)” Book Review: This book is for an UG “foundations” course on electronic testing. It covers all three types of electronic circuits. It first emphasizes the need for a design oriented project. Then, it discusses the need for a test oriented project. It covers the areas of interest such as test economics, classical semiconductor defects, structured design for testability techniques, for system-on-a-chip design, automatic test equipment, etc. Some important topics covered in the first part are VLSI testing process, fault modeling, product quality, etc. In the second part of test methods, some of the topics discussed are logic and fault simulation; combinational and sequential test generation; memory, delay and IDDQ test; etc. Towards the end, chapters on digital DFT, boundary scan standard, analog test bus standard, etc have been provided.
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