Here is the listing of Best reference books on Digital System Testing and Testable Design.
|1. “Testing of Digital Systems” by N. K. Jha and S. Gupta
Book Review: This book covers all the aspects that deal with the testing of digital systems. The book starts with the basics thereby going through automatic test pattern generation, testability design and self test built in of digital circuits. The advanced topics covered in the book are IDDQ testing, functional testing, delay fault testing, memory testing and fault diagnosis. The book also has detailed analysis of latest techniques which include test generation for fault models, testing techniques discussion at varied levels of integrated circuit hierarchy. The book also contains a chapter on system on a chip test synthesis.
|2. “Essentials of Electronic Testing” by M. L. Bushnell and V. D. Agrawal|
|3. “Digital Systems Testing and Testable Design” by M. Abramovici, M. A. Breuer and A. D. Friedman|
|4. “Built-in Test for VLSI: Pseudorandom Techniques” by P. H. Bardell, W. H. McAnney and J. Savir
Book Review: The book provides data about all the major concepts, techniques, problems and solutions in the field of pseudo random pattern testing. The book starts with a description of drawbacks of conventional testing which are applied to complex digital circuits taking into account the comparison the principles of design for testability of more advanced digital technology. The book also offers detailed discussions of test sequence generation and data compression including pseudorandom sequence generators and built in testing. The book also details random and memory testing and assesses the efficiency of such tests.
|5. “Fault Tolerant and Fault Testable Hardware Design” by P. K. Lala|
Sanfoundry Global Education & Learning Series – Best Reference Books!